Tektronix DC 5010 Anleitung Seite 67

Operating Instructions-DC 501 0
TEST
- A
Type:
Operational
Syntax:
TEST
Discussion:
The TEST command sets up the instrument to perform
repetitive self tests. The tests performed are the ROM tests,
Serial I10 Hardware Test, and the Counter Hardware Integ-
rity Test.
The tests performed by the TEST command are the
same as those tests performed during the power-on self
test sequence, with the exception of the instrument RAM
tests. The RAM tests are only performed during power-on.
If a failure is detected by any of the tests, the test se-
quence is halted. The sequence is restarted when the instru-
ment executes another TEST command or a RESET
command.
L - '
The results of each TEST sequence are made available
to be output by the instrument. A result of 0 indicates that
no failures were detected. If a failure is detected, the value
generated for output is the same as the error code that is
displayed for power-on self test failures.
See section on "Error and Status Reporting".
TEST
TlME (TIME A TO B)
Type:
Operational
Syntax:
TlME AB (argument is optional)
Examples:
TlME
TlME AB
Discussion:
The TlME command sets up the DC 501 0 to measure the
time interval from the first occurrence of an event on Chan-
nel A to the occurrence of the first succeeding event on
Channel B.
TlME (TIME A TO B)