Incident Light Techniques - Leica DMLB Bedienungsanleitung

Incident light techniques

Switching on the incident light source
The following incident light techniques are
described in the special supplementary manual
for DM LP (polarized light) and the DM LM
(material testing):
Brightfield BF, darkfield DF, polarized light Pol,
ICR interference contrast.
Switch on the lamp at the microscope (28.9) or
the external power unit. Hg lamps take a few
minutes to achieve their full intensity, and do not
ignite when hot!
Fig. 37 Lamphousing 106 (with 12 V 100 W halogen lamp)
1 Screw for opening the lamphousing, 2, 3 x/y lamp centration
(holes for Allen centering keys or 3 mm screwdriver, 4
Collector focusing, 5, 7 Clamp screw, 6 Filter holder
(intermediate piece)* for Ø 50 mm filters, pos. 3 and 4 do not
apply for Lamphousing 105/2 and 107 (not illustrated)
3 2
52
1
4 5 6 7
!
Attention:
For microscopes with transmitted/incident light
switchover on the right side of the microscope
base (not illustrated): switch to incident light.
Move the filter system or reflector (Fig. 16, p. 18)
into the light path (39.2). Open the light trap
(39.9). Remove any diffusing screens* from the
light path.
Make sure to adjust the light source
immediately, then form an image by one of
the following methods (Fig. 38 and 41), does
not apply for Lamphousing 105/2 and 107
(without centration).
Fig. 38 Lamphousing 106
Reflection of the lamp filament, greatly schematized: in reality
the reflection is extremely low in contrast, the bright overlap
area is wider and less defined. With Lamphousing 106 z the
reflection is rotated by 90°, → Fig. 41c
Caution: