ed weight, the receptacle can then be removed without damaging the mounting hole.
Extraction tool for receptacles
7.3)
Clean test probes
For severe contamination or contact difficulties, the test probes can be cleaned with commercially
available, soft plastic or glass fibre brush or cleaning mats.
ATTENTION
P
OSSIBLE DAMAGE TO PROPERTY
High radial forces can lead to deformation of the probe.
Be careful during cleaning that no side forces act on the test probes!
NOTE
W
EAR OF COATING
Manual cleaning of the test probe plunger tips has a slightly abrasive effect on the outer coating
layer. Repeated cleaning of tips can lead to removal of the conductive coating, which impairs the
electrical performance. However, keeping plunger tips free from contamination will ultimately en -
sure reliable test results and improve the life expectancy of the probe.
Vacuum-clean the working area from the loosened dirt particles after cleaning.
7.4)
Replacement parts
Please refer to the catalogue for INGUN interface blocks for the respective test probes to be used.
19
1) Stop
2) Weight
3) Compression spring
4) Adapter
5) Threaded pin
6) Insert (bit)
7) Probe plate
8) Receptacle
!
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INGUN, mistakes and technical changes reserved
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