Technical Data; Ra-510M - Mettler Toledo RA-510M Bedienungsanleitung

13.

Technical data

13.1

RA-510M

Measurement principle
n measurement
D
• Range
• Repeatability
• Resolution
Brix measurement
• Range
• Repeatability
• Resolution
Temperature
• Control
Accuracy
• Range
Accuracy (display)
Minimum sample quantity
Calibration
Data storage
Solids measurement
• Range
• Repeatability
• Resolution
Power supply connection
Voltage range
Line frequency
Power consumption
Fuse rating
RA-510M
METTLER TOLEDO
Measurement of the refractive index at wavelength
589.3 nm (D line of sodium); optical recognition of
the critical angle
1.32000 to 1.56000
±0.00005
0.00001
The tabulated values for the Brix calculation were
published in 1974 at the 16th Conference of the
ICUMSA (International Commission of Uniform
Methods for Sugar Analysis)
0.00 to 85.00%
±0.03%
0.01%
Measurement at boundary area prism-sample
Peltier semiconductor
±0.02 °C
15.00 to 40.00 °C
±0.05 °C
approx. 0.2 mL
with distilled water
through built-in lithium battery
HFCS-EPROM: The tabulated values for the HFCS
calculation were published in 1980 in J. Chem. Eng.
Data, 25, 277-282.
0.00 to 85.00%
±0.03%
0.01%
100 to 240 VAC ±10%
50 or 60 Hz
approx. 60 VA
T4L250V
Technical data
39