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Verfügbare Sprachen
Test scheme for modules ...; in the PA DRL test adapter, DRL slot
X
X
X
X
X
X
X
Upper slot
X
X
X
Upper slot
On the device
X
X
X
under test
Pin assignment
upper slot DPL 10, DRL
1
2
2
3
4
3
4
E
Device under test 1 ... 10
Test
pro-
Pin at
gram-
+/-
me
⇒
X
1
1
E
⇒
X
2
2
E
⇒
X
X
3
1
2
⇒
X
X
4
1
2
X
Upper slot with EF 10 DRL earthing frame
X
Upper slot without EF 10 DRL earthing frame
X
According to contacting
X
1 to 10
DPL 10...
Type
EM 2 DRL
E
1
2
DRL RE 5
DRL RE 12
3
4
DRL RE 24
DRL RE 48
DRL RE 60
DRL RE 180
DRL PD 180
DRL RD 5
DRL RD 12
DRL RD 24
DRL RD 48
DRL RD 60
DRL RD 110
DRL HD 5
DRL HD 24
DRL 10 B 180
DRL 10 B 180 FSD
Table 12
Remark
Test both polarities
Test both polarities
Test both polarities
Pin 3 and 4 short-circuited internally
Test program-
me
Part No.
⇒
1 (1
E)
LLV
ULV
in [V]
in [V]
907 496
0
1
907 420
6
10
907 421
14
19
907 422
30
37
907 423
59
70
907 424
76
91
907 425
189
261
907 430
-
-
907 440
-
-
907 441
-
-
907 442
-
-
907 443
-
-
907 444
-
-
907 445
-
-
907 465
-
-
907 470
-
-
907 400
182
279
907 401
182
279
Tests have to be carried out with both polarities+/- and
Polarität
Prüfung
Polarity
Test
+/-
5
6
4
7
8
3
2
9
+ / -
1
10
Programme
selector switch
Polarity
selector switch
Test program-
Test program-
me
me
⇒
⇒
2 (2
E)
3 (1
LLV
ULV
LLV
in [V]
in [V]
in [V]
in [V]
-
-
-
6
10
-
14
19
-
30
37
-
59
70
-
76
91
-
189
261
-
-
-
189
-
-
6
-
-
14
-
-
30
-
-
59
-
-
76
-
-
200
-
-
7
-
-
32
182
289
-
182
289
-
-/+!
Except for DRL 10 B 180 ...
Prüfschritt
Prüfung
Test step
Test pin
1: 1
E
2: 2
E
2
3
3: 1
2
1
4
4: 1 / 3
2 /
4
(bei: + / -)
(at: + / -)
Test step
selector switch
Test programme
⇒
4 (1
2, 3-4)
2)
ULV
LLV
ULV
in [V]
in [V]
-
0
1
-
0
1
-
0
1
-
0
1
-
0
1
-
0
1
-
0
1
261
0
1
10
0
1
19
0
1
37
0
1
70
0
1
91
0
1
223
0
1
11
0
1
38
0
1
-
0
1
-
0
1
25
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