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Test scheme for modules ...; in the PA DRL test adapter, DPL 10 slot
X
X
X
X
X
X
X
Upper slot
X
X
Lower slot
On the device
under test
X
X
Pin assignment
upper slot DPL 10, DRL
1
2
2
3
4
3
4
E
Device under test 1 ... 10
Pin assignment
lower slot DPL 1
E
1
2
3
4
Device under test 1 ... 10
24
Test
Pin at
programme
+/-
⇒
X
X
1
1
⇒
X
X
2
2
⇒
X
3
1
⇒
X
X
4
1
X
X
Upper slot without EF 10 DRL earthing frame
Lower slot
According to contacting
X
X
1 to 10
DPL 10...
Type
DPL 10 F ARE 24
DPL 10 F ARE 110
E
1
2
DPL 10 F ARE 12
DPL 10 F 10BASET
3
4
DPL 10 F ISDN 5
DPL 10 G3 110
DPL 10 G3 110 FS
DPL 10 G3 110 FSD
E
1
2
3
4
Table 11
Remark
Test both polarities
E
Test both polarities
E
Test both polarities
2
Pin 3 and 4 short-circuited internally
2
Test program-
me
Part No.
⇒
1 (1
LLV
in [V]
907 110
28
907 111
134
907 112
15
907 113
8
907 114
66
907 214
182
907 215
182
907 216
182
Tests have to be carried out with both polarities+/- and
Polarität
Prüfung
Polarity
Test
+/-
5
6
4
7
3
8
2
9
+ / -
1
10
Polarity
selector switch
Test program-
Test program-
me
me
⇒
2 (2
3 (1
E)
E)
ULV
LLV
ULV
LLV
in [V]
in [V]
in [V]
in [V]
38
28
38
-
166
134
166
-
21
15
21
-
13
8
13
8
110
66
110
8
279
182
279
-
279
182
279
-
279
182
279
-
-/+!
Except for DPL 10 G3...
Prüfschritt
Prüfung
Test step
Test pin
1: 1
E
2: 2
E
2
3
1
4
3: 1
2
4: 1 / 3
2 /
4
(bei: + / -)
(at: + / -)
Test step
Programme
selector switch
selector switch
Test programme
⇒
4 (1
2, 3-4)
⇒
2)
ULV
LLV
ULV
in [V]
in [V]
in [V]
-
0
1
-
0
1
-
0
1
14
0
1
13
0
1
-
0
1
-
0
1
-
0
1
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