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Verfügbare Sprachen
Test scheme for modules ...; in the PA DRL test adapter, DPL 1 slot
X
X
X
X
X
X
X
X
X
X
Upper slot
Lower slot
X
X
X
On the device
X
X
X
under test
Pin assignment
upper slot DPL 10, DRL
1
2
2
3
4
3
4
E
Device under test 1 ... 10
Pin assignment
lower slot DPL 1
E
2
1
3
4
Device under test 1 ... 10
Test pro-
Pin at
gramme
X
X
X
1
1
X
X
X
2
2
X
X
3
1
X
X
X
4
1
Upper slot without EF 10 DRL earthing frame
X
X
X
Lower slot
X
X
X
According to contacting
1 to 10
DPL 1...
Type
DPL 1F ALE 5
DPL 1F ALE 12
E
1
2
DPL 1F ALE 15
DPL 1F ALE 24
3
4
DPL 1F ALE 48
DPL 1F ALE 60
DPL 1F ALE 110
DPL 1F ARE 5
DPL 1F ARE 12
DPL 1F ARE 15
DPL 1F ARE 24
DPL 1F ALD 110
DPL 1F ATP 5
E
DPL 1F ARD 110
2
1
DPL 1F ARD 250
3
4
DPL 1G A 110
Table 10
Remark
+/-
⇒
Test both polarities
E
⇒
Test both polarities
E
⇒
Test both polarities
2
⇒
Pin 3 and 4 short-circuited internally
2
Test program-
me
Part No.
⇒
1 (1
LLV
in [V]
907 120
5
907 121
15
907 122
20
907 123
31
907 124
99
907 125
99
907 126
182
907 127
5
907 128
15
907 129
20
907 130
31
907 143
178
907 144
178
907 145
178
907 146
277
907 220
182
Tests have to be carried out with both polarities
Polarität
Prüfung
Polarity
Test
+/-
5
6
4
7
8
3
2
9
+ / -
1
10
Polarity
selector switch
Test program-
Test program-
me
me
⇒
E)
2 (2
E)
3 (1
ULV
LLV
ULV
LLV
in [V]
in [V]
in [V]
in [V]
10
5
10
-
21
15
21
-
28
20
28
-
41
31
41
-
141
99
141
-
141
99
141
-
229
182
229
-
10
5
10
-
21
15
21
-
28
20
28
-
41
31
41
-
283
178
283
183
283
178
283
8
283
178
283
183
424
277
424
277
279
182
279
-
+/- and -/+!
Prüfschritt
Prüfung
Test step
Test pin
1: 1
E
2: 2
E
2
3
3: 1
2
1
4
4: 1 / 3
2 /
4
(bei: + / -)
(at: + / -)
Programme
Test step
selector switch
selector switch
Test programme
⇒
4 (1
2, 3-4)
⇒
2)
ULV
LLV
ULV
in [V]
in [V]
in [V]
-
0
1
-
0
1
-
0
1
-
0
1
-
0
1
-
0
1
-
0
1
-
0
1
-
0
1
-
0
1
-
0
1
229
0
1
13
0
1
229
0
1
353
0
1
-
-
-
23
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