X-Rite i1 PRO Benutzerhandbuch Seite 41

Measurement background:
Maximal media thickness:
Minimal patch size in scanning mode:
Inter-Instrument-Agreement:
Short-term repeatability:
Emission
measurement:
Short-term repeatability:
Ambient light
measurement:
Interface:
OBC: Optical Brightener Compensation (OBC) with i1Profiler software
Calibration: Manual on external ceramic white reference
white, ISO 13655:2009; for measurements on backup board
3 mm (0.12") on backup board
7 x 10 mm (0.28" x 0.39") (Width x Height) with sensor ruler
10 x 10 mm (0.39" x 0.39") (Width x Height) without sensor ruler
0.4 ∆E94* average, 1.0 ∆E94* max.
(deviation from X-Rite manufacturing standard at a temperature of 23ºC
(73.4ºF) on 12 BCRA tiles (D50, 2º))
0.1 ∆E94* on white (D50,2°, mean of 10 measurements every 3 s on
white)
spectral radiance [mW/nm/m
Measurement range: 0.2 - 1200 cd/m
x,y ±0.002 typ. (5000 K, 80 cd/m
spectral irradiance [mW/nm/m
cosine corrected diffusor light measurement head
USB 1.1
2 2
/sr], luminance [cd/m
2
on a typical LCD-Monitor
2
)
2
], illuminance [lux]
EN
]
41