Chauvin Arnoux C.A 6545 Bedienungsanleitung Seite 47

Parameters
to be modified
Test duration of the test, in
"Programmed-time test" mode
1 nd and 2 nd time for
PI calculation
Time between
samples in mode
«Programmed-time test»
Limit for 500 V - 2 TΩ
Limit for 1000 V - 4 TΩ
Limit for 2500 V - 10 TΩ
Limit for 5000 V - 10 TΩ
Limit for Var-50/5000 V
Time
Date (Europe version)
version: USA, Europe
Erase memory
Selective deletion
of memory
Baud
Buzzer
Auto cut-off
Configuration by default
Dielectric test voltage:
Disturbance Limit
voltage
Automatic range
Test voltage locking
The values shown in this table, in the «Display / main» and «Display / small» columns are default values
programmed at the factory. In case of mistaken modification, it is possible to find them: see § 4.7.3.
Control
key main
tESt
second period
R-DAR-PI-DD
(10:00)
R (t)
ALARM 500 kΩ
ALARM (2 nd press) 1 MΩ
ALARM (3 press) 2.5 MΩ
rd
ALARM (4 th press) 5 MΩ
ALARM (5 th press) 5 MΩ
V-TIME
V-TIME (2 nd press) 17.03
V-TIME (3 rd press) USA/Euro
MEM then MEM (2 s) cLr
MEM then and
FrEE / OCC
and MEM (2 s)
PRINT 9600
On
(2 nd press) On
(3 rd press) DFLt
then START
(4 th press) SEt
(5 press) 0.03 U
th
(6 press) Auto
th
(7 th press) oFF
47
Display
small symbols
30 : 00 min. sec,
first period min.: sec
(01:00)
00 : 30 min.: sec
500 V ALARM < 30 k-2 TΩ and ><
1000 V ALARM < 100 k-4 TΩ and ><
2500 V ALARM < 300 k-10 TΩ and ><
5000 V ALARM < 300 k-10 TΩ and ><
Set ALARM < 10 k-10 TΩ and ><
12 :55
2000
ALL MEM
Number MEM
of OBJ: TEST.
bAUd
SEt
100 V V
dISt V
rAnG
1000 V
values
01:00 - 59:59
00:30 - 59:59
00:05 - 30:00
hh(00-23)
min (00-59)
dd.mm .yyyy
USA/Euro
00...99
300...9600
or "parallel"
ON / OFF
ON / OFF
40/5100 V
0,03-0,10-0,20
Auto/1/2/3
ON / OFF
40-5100 V