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Patent notice
Features of OMP400 probes and features of
similar probes are the subject of one or more of the
following patents and/or patent applications:
CN 101142461B
CN 101171493A
CN 101198836A
EP 0641427
EP 0974208
EP 1130557
EP 1185838
EP 1373995
EP 1457786
EP 1477767
EP 1477768
EP 1503524 B
EP 1701234
EP 1734426
EP 1866602
EP 1880163
EP 1893937
C
EP 1988439
EP 2154471
IN 6963/DELNP/2007A
IN 8669/DELNP/2007A
IN 9914/DELNP/2007A
JP 2004-279,417
JP 2004-522,961
JP 2006-313567
JP 2008-203270
JP 2008-537107
JP 2008-541081
JP 2008-544244
JP 3,634,363
JP 3967592
JP 4294101
US 2009-0130987-A1
US 5,671,542
US 6,776,344 B2
US 6,839,563 B1
US 6,860,026 B2
US 6472981 B2
US 7145468 B2
US 7285935
US 7441707
US 7486195
US 7603789
US 7689679
US 7792654
US 7812736
3-7
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