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Introduction
Dear Customer,
With the LCR Measuring Instrument 4073 you have acquired a component measu-
ring instrument to the latest technological standard.
The LCR Measuring Instrument 4073 was constructed following DIN VDE 0411,
Part 1 and is EMC-tested (for domestic applications) and therefore meets the
requirements of applicable national and European guidelines. Conformance
to these has been proven; the relevant documents are lodged with the manu-
facturer.
To maintain this condition and to guarantee safe operation, the user must observe
these operating instructions without fail!
In case of query, consult our
Technical Advisory Service:
Tel. 0180 / 531 21 19
Mon- Fri 08.00 to 18.00 (CET)
Intended use
of the LCR Measuring Instrument 4073
Measurement of unipolar or bipolar capacitors (C) from approx. 10 pF to 1000 µF =
1 mF max.
Measurement of resistance (R) up to 20 MOhm max.
Measurement of inductance (L) up to 20 H max.
Diode test and acoustic continuity check (< 200 Ohm)
Measurement in damp areas, outside, or in unfavourable environmental conditions,
is not permitted. Unfavourable ambient conditions include::
- moisture or excessive air humidity
- dust and combustible gases, fumes or solvents,
- thunderstorms or storm conditions such as strong electrostatic fields, etc.
Any use other than as described above can lead to damage to the unit; in addition
this is accompanied by dangers such as short circuit, fire, electric shock, etc. No part
of the product must be modified or converted! The safety instructions are to be
followed without fail!
4
B Meettoleranties
Aanduiding van de meettoleranties in ±(% van de aflezing+aantal van de digits=fout
digitale positie)
Betrifsmodus Meetbereik
Nauwkeuriheid Resolutie
Capaciteit
2nF
±(2%+2dgts)
20nF
±(2%+2dgts)
200nF
±(2%+2dgts)
2uF
±(2%+2dgts)
20uF
±(2%+2dgts)
200uF
±(2%+2dgts)
1000uF
±(3%+2dgts)
pF = pico-Farad = 10 exp. -12;
nF = nano-Farad = 10 exp. -9; uF = micro-Farad = 10 exp. -6
Overbelastingsbeveiliging: max. 35 VAC (50/60Hz) resp. 35 VDC, beide max. 10s
Inductiviteit
2 mH
±(2%+2dgts)
20 mH
±(2%+2dgts)
200 mH
±(2%+2dgts)
2 H (< 0,5H)
±(2%+2dgts)
2 H (> 0,5H)
±(5%+1dgt)
20 H
±(5%+1dgt)
uH = micro-Henry = 10 exp. -6; mH = milli-Henry = 10 exp. -3; H = Henry = As/V
Overbelastingsbeveiliging: max. 35 VAC (50/60Hz) resp. 35 VDC, beide max. 10s
Weerstand
200 Ohm
±(0,8%+1dgt)
2 kOhm
±(0,8%+1dgt)
20 kOhm
±(0,8%+1dgt)
200 kOhm
±(0,8%+1dgt)
2000 kOhm
±(0,8%+1dgt)
20 MOhm
±(1,5%+2dgts)
Spanning bij het open meetcircuit: in de bereiken tot 2000 kOhm: ca. 600 mV
In het bereik 20 MOhm: ca. 300 mV
Diodetest
Teststroom: ca. 1 mA; Meting van de doorlaatspanning
Spanning bij open meetcircuit: ca. 2 VDC;
Testfrequentie
1pF
250 Hz
10pF
250 Hz
100pF
250 Hz
1nF
250 Hz
10nF
ca. 50 Hz
100nF
ca. 50 Hz
1uF
ca. 5 Hz
1uH
ca. 250 Hz
10uH
ca. 250 Hz
100uH
ca. 250 Hz
1mH
ca. 250 Hz
1mH
ca. 250 Hz
10mH
ca. 250 Hz
0,1 Ohm
1 Ohm
10 Ohm
100 Ohm
1 kOhm
10 kOhm
65
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