LIMIT 610 Bedienungsanleitung Seite 10

English
Note
• The test leads can add 0.1 to 0.3 of error to resistance measurement. To obtain precision
readings in low-resistance measurement, that is the range of 400 , short-circuit the input
terminals beforehand, using the relative function. Push REL button for automatically subtract
the value from the short-circuited test leads. OL displays when the circuit is open or the resistor
value is higher than max range.
Diode test (See fig 3)
Use the diode test to check diodes, transistors, and other semiconductor devices. The diode test
sends a current through the semiconductor junction, and then measures the voltage drop across the
junction. A good silicon junction drops between 0.5V and 0.8V.
To test a diode out of a circuit, connect as follows:
1. Insert the red test lead into the HzV terminal and the black test lead into the COM terminal.
2. Set the rotary switch to diode position (blue).
3. Push blue button to select diode function. Displays shows diode symbol.
4. For forward voltage drop readings on any semiconductor component, place the red test lead on
the component's anode and place the black test lead on the component's cathode.
The measured value shows on the display.
Continuity test (See fig 4)
To test for continuity, connect as follows:
1. Insert the red test lead into the HzV terminal and the black test lead into the COM terminal.
2. Set the rotary switch to continuity position (blue).
3. Push blue button to select continuity function. Displays shows continuity symbol.
4. Connect the test leads across with the object being measured. The buzzer sounds if the
resistance of a circuit under test is less than 70 .
Capacitance measurement (See fig 5)
1. Insert the red test lead into the HzV terminal and the black test lead into the COM terminal.
2. Set the rotary switch to capacitance position (blue).
3. Push blue button to select capacitance function. Displays shows nF symbol.
4. Connect the test leads to the object being measured. The measured value shows on the display.
Note
•When OL displays the capacitor is short-circuit or the selected range is to low.
•To minimize the measuring error caused by the distributed capacitor, the testing lead should be
short as possible. It takes longer time when testing a high capacitor value, testing time is around
15 seconds in 100 µF range.
• Use the REL function for reduce capacitance stored in the test leads when measure small value
of capacitance.
Frequency ( See fig 1 )
1. Insert the red test lead into the HzV terminal and the black test lead into the COM terminal.
2. Set the rotary switch to Hz% position.
3. Push Hz% button for select measuring frequency in Hz or duty cycle in %. Display shows Hz
or %.
3. Connect the test leads across with the object being measured. The measured value shows on the
display.
Note. When measuring V, µA, mA or A also frequency or duty cycle can be displayed by push
the Hz% button. Push button by step between frequency, duty cycle or return to previous
measurement mode.
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