Specification - X-Rite i1 PRO Benutzerhandbuch

Specification

Spectral
engine:
Spectral range:
Physical sampling interval:
Optical resolution:
Spectral reporting:
Measurement frequency in scanning
mode:
Optics: Measurement geometry:
Measurement aperture:
Illumination spot size:
Light source:
Reflectance
measurement:
Measurement conditions:
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i1 ® technology (holographic diffraction grating with 128 pixel diode array)
with built-in wavelengths check
380 - 730 nm
3.5 nm
10 nm
380 nm ... 730 nm in 10 nm steps
200 measurements per second
45º/0º ring illumination optics, ISO 13655:2009
4.5 mm (0.18") diameter
(effective measurement aperture during scanning is depending on the
patch size and measurement speed)
3.5 mm (0.14")
Gas filled Tungsten (illuminant type A) and UV LED
spectral reflectance [dimensionless]
UV included - ISO 13655:2009 measurement condition M0
D50 - ISO 13655:2009 measurement condition M1
UV excluded Filter - ISO 13655:2009 measurement condition M2
OBC:
Calibration:
Measurement background:
Maximal media thickness:
Minimal patch size in scanning mode:
Inter-Instrument-Agreement:
Short-term repeatability:
Emission
measurement:
Measurement range:
Short-term repeatability:
Ambient light
measurement:
Interface:
Optical Brightener Compensation (OBC) with i1Profiler software
Manual on external ceramic white reference
white, ISO 13655:2009; for measurements on backup board
3 mm (0.12") on backup board
7 x 10 mm (0.28" x 0.39") (Width x Height) with sensor ruler
10 x 10 mm (0.39" x 0.39") (Width x Height) without sensor ruler
0.4 ∆E94* average, 1.0 ∆E94* max.
(deviation from X-Rite manufacturing standard at a temperature of 23ºC
(73.4ºF) on 12 BCRA tiles (D50, 2º))
0.1 ∆E94* on white (D50,2°, mean of 10 measurements every 3 s on
white)
2 2
spectral radiance [mW/nm/m /sr], luminance [cd/m ]
2
0.2 - 1200 cd/m on a typical LCD-Monitor
2
x,y ±0.002 typ. (5000 K, 80 cd/m )
2
spectral irradiance [mW/nm/m ], illuminance [lux]
cosine corrected diffusor light measurement head
USB 1.1
EN
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