YOKOGAWA DPharp EJX Serie Bedienungsanleitung Seite 24

D1
• HART output
• Process Alerts (DD)
• Process Alerts
(DTM)
4-20mA
• Burst Message 1
• Poll addr
• Loop current mode
HART 7
• Num req preams*
• Num resp preams*
HART 7
• Burst Condition
HART 7
• Burst mode
HART 5
• Burst option
HART 5
*: Auch verfügabr bei
1 bis 5 V DC-Ausgang.
• Burst Message 2
• Burst Message 3
• Event Notification
• PV Update time
period (DD)
• SV Update time
period (DD)
• TV Update time
period (DD)
• Update time period
(DTM)
• SP update time
(DTM)
• Temp update time
(DTM)
• Pres Alert mode
• Hi Alert Val
• Config Pres Alerts
• Lo Alert Val
• LSL
• USL
• SP Alert mode
• Config SP Alerts
• Temp Alert mode • Temp Hi Alert Val
• Config Temp Alerts
• Temp Lo Alert Val
• Digital Output
• DO Config
EJX
• DO Select
• DO Signal type
• DO Test
• Pres Alert • Pres Alert mode
• Config Pres Alerts
• SP Alert • SP Alert mode
• Config SP Alerts
• Temp Alert mode
• Temp Alert
• Config Temp Alerts
• Digital Output
• DO Config
EJX
• DO Select
• DO Signal type
• DO Test
<3 Parameterkonfiguration>
• Burst mode
• Burst Command
• Burst Device
Variables
• Set Burst Trigger
• Set Burst Period
• Burst Msg Trigger
Mode
• Burst Trigger Level
• Update Period
• Max Update Period
Wie oben
Wie oben
• Event Notification
Control
• Event Mask
• Set Event
Notification Timing
• Event Notification
Retry Time
• Max Update Time
• Event Debounce
Interval
• Knowledge (DD)
• Knowledge (DTM)
• SP Hi Alert Val
• SP Lo Alert Val
• SP LSL
• SP USL
• Hi Alert Val
• Lo Alert Val
• LSL
• USL
• SP Hi Alert Val
• SP Lo Alert Val
• SP LSL
• SP USL
• Temp Hi Alert Val
• Temp Lo Alert Val
3-6
: nur HART 5
HART 5
: nur HART 7
HART 7
: nur Serie EJX
EJX
: nur 4-20mA-Ausgang
4-20mA
• Burst Variable Code
(DD)
• Device Variable
Code (DTM)
• Device Status Mask
• Status group 1 Mask
to 10 Mask
• Ext dev status Mask
• Device Diagnostic
Status 0 Mask
• Device Diagnostic
Status 1 Mask
• AO saturated Mask
• AO fixed Mask
• Event Status
• Time First Unack
Event Triggered
• Acknowledge Event
Notificatoin
• Event Status
• Event Number
• Time First Unack
Event Triggered
• Latched Cfg chng
count
• Latched Device
Status
• Latched Status
group 1 to 10
• Latched Ext dev
status
• Latched Device
Diagnostic Status 0
• Latched Device
Diagnostic Status 1
• Latched AO
saturated
• Latched AO fixed
F0301-07.ai
IM 01C25T01-06D-E