Specifications
Frequency range: 0.1MHz to 1000MHz
(lower frequency limit
depends on probe type)
Output impedance:
Output connector:
Input capacitance:
(high impedance probe)
Max. Safe Input Level:
1dB-compression point:
(frequency range dependent)
DC-input voltage:
Supply Voltage:
4 AA size batteries
Supply-power of HM5010/11/12/14
Supply Current:
8mA (H-Field Probe)
15mA (E-Field Probe)
24mA (High Impedance Probe)
Near Field Sniffer Probes HZ 530
The HZ530 is the ideal toolkit for the
investigation of RF electromagnetic
fields. It is indispensable for EMI
pre-compliance testing during
product development, prior to third
party testing. The set includes 3
hand-held probes with a built-in pre-
amplifier covering the frequency range
from 100kHz to over 1000 MHz.
The probes - one magnetic field pro-
be, one electric field probe, and one
high impedance probe, are all
matched to the 50Ω inputs of
spectrum analyzers or RF receivers.
The power can be supplied either from
batteries, Ni-Cads or through a power
cord directly connected to an HM5010/
5011/5012/5014 series spectrum
analyzer.
Signal feed is via a 1.5m BNC-cable.
When used in conjunction with a
spectrum analyzer or a measuring
receiver, the probes can be used to
locate and qualify EMI sources, as
well as evaluate EMC problems at the
breadboard and prototype level.
They enable the user to evaluate
radiated fields and perform shield
effectiveness
comparisons.
Mechanical screening performance
and immunity tests on cables and
components are easily performed.
The H-Field Near-Field Probe
The H-Field probe provides a voltage
to the connected measurement
system which is proportional to the
magnetic radio frequency (RF) field
Subject to change without notice
(Reference Temperature 23°C ±2°C)
Probe Dimensions:
Housing:
50 Ω
(electrically shielded internally)
BNC
Package contents:
2pF
Carrying case, 1 H-Field Probe
1 E-Field Probe, 1 High Impedance
+10dBm
-2dBm
20V max.
(Batteries or Ni-Cads are not included)
6V DC
strength existing at the probe location.
With this probe, circuit RF sources
may be localized in close proximity of
each other. The H field will decrease
as the cube of the distance from the
source. A doubling of the distance will
reduce the H field by a factor of eight
(H = 1/d³); where d is the distance.
In the actual use of the H field sensor,
one observes therefore a rapid increase
of the probe's output voltage as the
interference source is approached.
While investigating a circuit board, the
sources are immediately obvious. It is
easily noticed which component (e.g.
IC) causes interference and which
does not. In addition, by use of a
spectrum analyzer, the maximum
amplitude as a function of frequency
is easily identified. Therefore, one can
eliminate early in the development
components which are not suitable for
EMC purposes. The effectiveness of
countermeasures can be judged
easily. One can investigate shields for
"leaking" areas and cables or wires for
conducted interference.
The High Impedance Probe
The high impedance probe (Hi-Z)
permits the determination of the radio
frequency interference (RFI) on indivi-
dual contacts or printed circuit traces.
It is a direct contact probe. The probe
is of very high impedance (near the
insulation re-sistance of the printed
circuit material) and loads the test
point with only 2 pF (80Ω at 1 GHz).
Near Field Sniffer Probes HZ560
40x19x195mm
(WxDxL)
Plastic;
Probe, 1 BNC cable (1.5m)
1 Power Supply Cable
Operators Manual
Thereby one can measure directly in a
circuit without significantly influencing
the relationships in the circuit with the
probe.
One can, for example, measure the
quantitative effectiveness of filters or
other blocking measures. Individual
pins of ICs can be identified as RFI
sources. On printed circuit boards,
individual problem tracks can be
identified. With this Hi-Z probe indivi-
dual test points of a circuit can be
connected to the 50Ω impedance of a
spectrum analyzer.
The E Field Monopole Probe
The E field monopole probe has the
highest sensitivity of the three probes
and can be used as an antenna for
radio or TV reception. With this probe
the entire radiation from a circuit can
be measured. It is used to determine
the effectiveness of shielding
measures. With this probe, the entire
effectiveness of filters can be verified
by measuring the RFI which is
conducted along cables that leave
the equipment and may influence the
total radiation. The E field probe may
be used to perform relative
measurements for certification tests.
This makes it possible to apply
remedial suppression measures so
that any requalification results will be
positive. Pre testing for certification
may be performed so that no surprises
are
encountered
during
certification tests.
the
29