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BEHA UNITEST TELARIS Bedienungsanleitung Seite 50

Fi/rcd-analyzer
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Technical Data
Table 4 Trip times for selective RCB´s
Fi/RCD-Type
Current Type
IΔN
100mA/
300mA/
500mA/
1000mA
Table 5 Trip times for RCB´s with over curent protection
Fi/RCD-Type
Current Type
IΔN
10mA/
30mA/
100mA/
300mA/
500mA/
1000mA
50
Current Type
Test Current
IΔN
IΔN
x0.5
0.5x
x1
1x
x2
2x
x5
5x
x0.5
0.35x
x1
1.4x
x2
2.8x
x5
7x
x0.5
0.5x
x1
2x
x2
4x
x5
10x
Current Type Test Current prescribed Test Time
IΔN
IΔN
Trip Time
x0.5
0.5x
-
x1
1x
<300ms
x2
2x
<150ms
x5
5x
<40ms
Ramp
0.4x- 1.4x
<300ms
x0.5
0.35x
-
x1
1.4x
<300ms
x2
2.8x
<150ms
x5
7x
<40ms
Ramp
0.1x- 1.4x
<300ms
x0.5
0.5x
-
x1
2x
<300ms
x2
4x
<150ms
x5
10x
<40ms
Ramp
0.1x- 2x
<300ms
prescribed
Test Time
Trip Time
-
500ms
500ms
130...500ms
200ms
60...200ms
150ms
50...150ms
-
500ms
500ms
130...500ms
200ms
60...200ms
150ms
50...150ms
-
500ms
500ms
< 500ms
200ms
< 200ms
150ms
< 150ms
2000ms, IΔN≥100mA: 500ms
500ms
150ms
40ms
300ms
2000ms, IΔN≥100mA: 500ms
500ms
150ms
40ms
300ms
2000ms, IΔN≥100mA: 500ms
500ms
150ms
40ms
300ms
Standard
Fi/RCD
Analyzer
IEC61008-1
IEC61008-1
IEC61008-1
IEC61008-1
IEC61008-1
IEC61008-1
IEC61008-1
IEC61008-1
0664- Teil100 √
0664- Teil100 √
0664- Teil100 √
0664- Teil100 √
Standard
Fi/RCD
Analyzer
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1
IEC61009-1

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