Megger LCB2000/2 Bedienungsanleitung Seite 26

Operation - RCD Testing
Setting A (Non UK Countries):
The contact or fault voltage is displayed with the Loop
resistance, trip current and trip resistance available by
pressing the ENTER key.
Setting b (UK):
The trip time is displayed with the trip resistance,
contact voltage and loop resistance available by
pressing the ENTER key. The trip current and the trip
resistance values are displayed with the TEST TYPE
symbol. The Trip resistance is the fault required to trip
the RCD.
Auto Sequence RCD Test
If the RCD is not located near a convenient installation
socket, it could mean walking back and forward
between the RCD and the instrument to reset the RCD
each time it trips out. To simplify and speed up
sequence testing, the instrument can be set to
automatically perform each subsequent test in the
sequence each time that the power is restored. This
test depends upon whether Setting A or Setting b is
selected. The Overcurrent or Fast Trip is 150mA if
Setting b is selected, and 5 x
The display shows 150mA or 5
The test procedure is as follows:-
1. Connect to the supply as detailed on the next page.
2. Select the RCD rated current on the rotary switch.
3. Select Auto RCD test sequence by pressing the
if Setting A is selected.
I
symbols as appropriate.
I
TEST TYPE key until the
symbols are displayed in sequence. Auto test is
only applicable to a.c. sensitive non delayed RCDs,
therefore Type segments are not displayed.
4. Press and release the Test button.
5. Reset the RCD within 30 seconds after each trip
test.
6. Tests will be carried out in the sequence
180°, Fast Trip 0° and 180°. After each trip test, the
instrument will wait for up to 30 seconds for the
supply to be switched back on before continuing
with the next test. The test sequence will abort if
any of the tests fail, or if the RCD is not reset within
the time limit.
On completion, the result of the last Fast trip test is
displayed. Press the ENTER key to sequentially
display:-
Supply voltage
Supply Frequency
Contact voltage
Earth Loop Resistance (approximation)
0° trip test time
180° trip test time
0° Fast trip test time
180° Fast trip test time
All results can be stored under a single circuit
reference. See 'Test Result Storage, Deletion and
Retrieval'.
; 0°; 180° and Fast trip
1 ⁄
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2
, 0°,
1 ⁄
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2
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