CX 20017
oc
pono
CIN
CIN
COUT
BIAS
BCL
DGND
AGND
AVEE
NC
Koum
mp
ISET
DER
TTL-ECL
interface
Circuit
Timing
Generator
Circuit
DVEE
SUB
TEST!
VCC
TEST2
LATCH
LACK
WCLK
BCLK
DIN
LRCK
ec
our
DGND
DVEE
TESTI
and
TEST 2 are
to be used
open
—HM 6116
Kane Matrix
128 x 128
Cour 1/0
TL 40 H 004 P
"i
Lol,
Gates
[em
> >
Do
GND
ER?
H
14
ide
28
4
5
MC 4558
7
8
TL
082
L
272
15
RC 4560
RC 5532
TL 40 H 004
HM 6116
11
HCF 4053
IN/OUT
Yoo
cy
cr
by
be
ay
âc
© © O © © E
RE
©
Regulated
Current
A
OUT/IN
Discharge
Discharge
$
Sgt ton a
(4)
T
8
|
fre)
]
QUT/IN
D
(9—
Ea
AB
Säin
15
Upper
8-bit
Shift
Register,
Latch,
Counter
é
|
BS
QUT/IN
|
Gi
|
SLÖ
4
i
le |—4
INN
Lower 8-bit Shift Register. Latch. Counter
6)
MM
EM
"ze
ax or bx or Cx
vss
VEE
ay or by or cy
NONE
X : Dont
care
HD 6805 V1
Times
Senn mm
a
pied
À 2
d
Innex
a
à
die
REGISTER
x
bs
BRETTON
ed
Pont
Nesisten
S
À
SE
lo
Stack
mm
"
1
E
CP DNE
porr GL
fom
PROGRAM
'a
Pau
COUNTER
ad
dl
A
CH
m8
Lines
7
9
1
2
Port
à
SE
5
Lues
$
7
YW
12
13
20
21
CX 20017
HD 6805
Ersatz
Pos.
DA
DA
|
TA
TA
4
TA
í
TA
`
TA
|
TA 1
TA t
TA 2